IMD—Software for modeling the optical properties of multilayer films
نویسنده
چکیده
A computer program called IMD is described. IMD is used for modeling the optical properties ~reflectance, transmittance, electric-field intensities, etc.! of multilayer films, i.e., films consisting of any number of layers of any thickness. IMD includes a full graphical user interface and affords modeling with up to eight simultaneous independent variables, as well as parameter estimation ~including confidence interval generation! using nonlinear, least-squares curve fitting to user-supplied experimental optical data. The computation methods and user interface are described, and numerous examples are presented that illustrate some of IMD’s unique modeling, fitting, and visualization capabilities. © 1998 American Institute of Physics. @S0894-1866~98!01604-6#
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